For many of today’s advanced materials, analysis by TEM is the best technique for studying material structure and properties. Fischione Instruments’ Model 1051 TEM Mill is an excellent tool for creating the thin, electron transparent specimens needed for TEM imaging and analysis.
Ion milling with low angles of incidence, combined with low-energy ion source operation, minimizes irradiation damage and specimen heating. Because it facilitates the uniform thinning of dissimilar materials, low-angle milling is highly beneficial when preparing layered or composite materials, as well as cross-sectional TEM (XTEM) specimens.
✓ High energy operation for rapid milling; low energy operation for specimen polishing
✓ Two independently adjustable TrueFocus ion sources
✓ Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 10 keV)
✓ Continuously adjustable milling angle range of -15 to +10°
✓ Adjustable 10-inch touch screen with a user-friendly interface for simple setup of milling parameters
✓ Specimen holder with x-y adjustment
✓ In situ viewing and image capture during milling
✓ Liquid nitrogen-cooled specimen stage
Request your product demo here
Would you like to learn more about Fischione Instruments, or see it in action yourself? We would be happy to arrange a personal demonstration. Or contact us to discuss the solutions desktop SEM can provide for your lab.