Products
SEM solutions for imaging
Phenom Pure: REM der Einstiegsklasse
Phenom Pro: Research-level SEM
Phenom XL: High Throughput SEM
Phenom Pharos: FEG SEM
AXIA ChemiSEM
Automated SEM
ParticleX TC
ParticleX Battery
ParticleX AM
ParticleX Steel
ParticleX GSR
AsbestoMetric
SEM for analyzing
Phenom ProX: Research-level SEM
Phenom XL: High Throughput SEM
Phenom Pharos: FEG SEM
AXIA ChemiSEM
Software solutions for measuring
PoroMetric
3D Reconstruction
ParticleMetric
FiberMetric
PPI
Sample Preparation
LUXOR
Au
LUXOR
Pt
TrionMill & SEM Mill
TEM Mill
NanoClean
Nebula
Accessories
STEM sample holder
Electrical Feed-through Sample Holder
Tensile sample holder
Temperature Controlled Sample Holder
Charge reduction sample holder
Eucentric sample holder
Micro to Nano
Applications
News
Events
About us
Get in touch
English
Nederlands
Français
Deutsch
Products
SEM solutions for imaging
Automated SEM
SEM for analyzing
Software solutions for measuring
Sample Preparation
Accessories
Applications
News
Events
About us
Get in touch
English
Nederlands
Français
Deutsch
Events
Phenom SEM on tour
