ParticleMetric automates particle detection, analysis, and reporting. Reports provide statistically significant morphology and particle size data for many submicron particles applications. The software allows access for users to create histograms and scatter plots based on the data collected.

ParticleMetric provides a level of visual exploration beyond optical microscopy that can enhance quality control and accelerate process development.

 Correlate particle features such as diameter, circularity, aspect ratio, and convexity
 Detect up to 1000 particles per minute
 Combine with Automated Image Mapping for statistical data analysis with high-quality SEM images
 Revisit particles collected for further analysis
 Visualize large datasets in histograms or scatter plots of any given parameter
 Plot graphs in linear, log, or double log scale – by number or volume
 Reporting tool allows easy exporting of data

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Would you like to learn more about the Phenom SEM, or see it in action yourself? We would be happy to arrange a personal demonstration. Or contact us to discuss the solutions desktop SEM can provide for your lab.