The world’s first desktop STEM sample holder combined with a FEG source. Designed for the Phenom Pharos Desktop SEM — study standard 3 mm TEM grids in transmission mode with fully automated BF, DF, and HAADF imaging.
Compatible with: Phenom Pharos Desktop SEM
Features
Scanning transmission electron microscopy workflow
Streamlines the transmission microscopy workflow for users who need quick answers. STEM imaging can be performed in under 3 minutes after sample loading. Fully integrated into the user interface — switch between bright field and dark field images with just a few clicks.
Application versatility
The FEG desktop system now offers STEM capabilities for everyone, with fully automated imaging for bright field, dark field, and HAADF modes. Suited for battery, metals and alloys, catalysts, nanomaterials, and biological samples such as tissues.
Easy to train
The STEM imaging detector is seamlessly integrated into the regular SEM user interface, maintaining the same level of ease of use. All auto-functions remain accessible, and capturing an image is as simple as clicking a mouse button.
High-resolution imaging
Transmission modes allow for resolutions finer than those possible with the SED (Secondary Electron Detector). Capture detailed images of features below 10 to 15 nanometers.
Specifications
| Description | The world's first desktop STEM sample holder combined with a FEG source |
| Catalog number | STEM-HOLDER |
| Sample mounting | Standard Ø 3 mm TEM grids |
| Electronics | Fully integrated, no cable connections |
| Imaging methods | Bright-field, dark-field, high-angle annular dark-field |
| Resolution | 1 nm BF (10 nm Au on Cu/Al TEM grid) |
| EDS | Elemental identification possible |
| Software | Integrated Phenom UI |
Request your product demo here
Would you like to learn more or see the Phenom STEM Sample Holder in action? We are happy to arrange a personal demonstration.