LiteScope Phenom

LiteScope Phenom combines the proven Thermo Scientific Phenom XL G3 Desktop SEM with the in-situ correlative power of NenoVision LiteScope AFM-in-SEM. The result is a practical all-in-one solution for rapid materials imaging and analysis with true 3D surface information and local material property mapping. Without moving the sample between instruments.

It brings correlative AFM-in-SEM characterization to an accessible desktop platform, without the cost and footprint of a separate high-end SEM and a standalone AFM.

  • Large sample stage up to 100 mm × 100 mm
  • Average time to SEM image: 60 seconds
  • In-situ AFM inside the SEM chamber
  • Correlative AFM + SEM in one workflow

Combine the Thermo Phenom XL Desktop SEM with Nenovision true 3D correlative insight

The Thermo Scientific Phenom XL G3 Desktop SEM sets the stage for faster and more efficient quality control and failure analysis. Its larger stage accommodates samples up to 100 mm × 100 mm, while automation for routine analytical tasks delivers accurate, reproducible results with an average time to image of 60 seconds.

LiteScope AFM-in-SEM extends this workflow with simultaneous AFM and SEM acquisition, enabling seamless correlation of complementary datasets in the same location, at the same time and under the same conditions.

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Why LiteScope Phenom?

  • Analyze larger or multiple samples efficiently with a stage that accommodates samples up to 100 mm × 100 mm.
  • Automate routine SEM imaging and analysis while adding correlative AFM topography and roughness data.
  • Acquire SEM and AFM data in situ to reduce transfer-related contamination, oxidation and drift.
  • Use SEM navigation for precise localization of the AFM probe at the region of interest.
  • Expand 2D SEM imaging with local mechanical, electrical and functional property mapping.
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Applications

Metals and alloys

Ideal for metallography, coating analysis, wear studies and failure analysis. LiteScope Phenom combines fast SEM screening with AFM-based topography, roughness and local mechanical contrast on critical surface features.

Particles and powders

For particles and powders, LiteScope Phenom delivers a fast route from SEM overview imaging to nanoscale surface characterization. It supports morphology, agglomeration, surface texture and height analysis within the same region of interest.

Battery materials

Battery workflows benefit from correlating particle structure with nanoscale surface and functional information in one environment. LiteScope Phenom supports the analysis of cathodes, anodes, coatings and degradation mechanisms with less sample handling.

Correlate microstructural SEM contrast with AFM topography and roughness on inclusions, cracks, coatings and wear tracks.
Screen particle populations rapidly with SEM and zoom in on nanoscale texture and height detail with in-situ AFM.
Combine rapid SEM imaging with AFM topography and local functional characterization for battery particles, coatings and interfaces.

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Would you like to learn more or see the LiteScope Phenom in action? We are happy to arrange a personal demonstration.

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