AFM-in-SEM Explained: Explore Surfaces Beyond the SEM Image

Exclusive live webinar

Learn how Atomic Force Microscopy works, what it measures and how it complements SEM imaging with a live LiteScope Phenom demonstration.
Atomic Force Microscopy provides detailed 3D information about surface topography, height and roughness at the nanoscale. But how does AFM work, and what can it reveal that conventional SEM imaging cannot?

Join this free 40-minute webinar for an accessible introduction to AFM. Our application specialists will explain the measurement principles, discuss the complementary information provided by AFM and SEM, and demonstrate the LiteScope-in-Phenom workflow on a real sample.