Thermo Scientific™ Phenom™ Desktop Scanning Electron Microscopes have long delivered exceptional performance and maximum flexibility. The newest Phenom XL G3 builds on this strong foundation with major upgrades that improve analytical quality and boost overall efficiency.
Flexibility is key to productivity in sample analysis, and the Phenom XL G3 was engineered with this in mind. It stands out as one of the fastest and most adaptable desktop SEMs in its class.
Discover all the details and specifications that make the Phenom XL G3 a leader in its class. Get insights into performance, design, and features that power your results.
The Phenom XL G3 features an extra-large stage capable of holding samples up to 100 × 100 mm and 40 mm high, or up to 36 standard 12 mm pin stubs. This gives you the freedom to examine large wafers, multiple smaller specimens, or complex parts—all in a single run. The result is significant time savings and improved sample integrity, thanks to fewer transfers between instruments.
With its high-capacity stage and long-lasting electron source, the Phenom XL G3 greatly expands automation options. It enables fully automated, around-the-clock analysis of large batches of samples—24 hours a day, 7 days a week.
With a resolution of 9 nm, the system reveals even the finest structural details, and its average time-to-image of under 2 minutes makes it much faster than comparable desktop SEMs. Combined with a new, intuitive user interface that streamlines setup and operation, the XL G3 delivers exceptional speed, clarity, and ease of use across diverse applications.
To support the specific demands of both research and routine laboratories across numerous industrial fields, the Phenom XL G3 can be configured with a eccentric sample holder, a tensile–compression stage, and even an AFM-in-desktop SEM solution. This versatility within a compact platform allows the XL G3 to address an exceptionally broad range of analytical needs.
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