Thermo Scientific’s Phenom ParticleX is a powerful solution that brings together scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) in a fully automated, high-throughput desktop platform. By combining advanced imaging with automated chemical analysis, ParticleX enables faster, more consistent, and more accessible materials characterization than ever before.
With the integration of the Phenom XL desktop SEM and ParticleX software, this compact system offers automated particle detection, morphological analysis, chemical composition analysis, and classification—streamlining tasks that would otherwise require significant time and operator expertise.







